Analysis of Dielectric-Loaded Cavities for Characterization of the Nonlinear Properties of High Temperature Superconductors
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چکیده
This work describes and compares two alternative methods of analyzing dielectric-loaded cavities for measurement of intermodulation distortion in HTS films. One of them is based on assuming a specific type of HTS nonlinearities and developing theoretical equations based on them. The second is based on a numerical approach that can be applied to many types of nonlinearities. Both methods are shown to work on measured data of representative HTS films.
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تاریخ انتشار 2001